Hiroyuki Yotsuyanagi
Hiroyuki Yotsuyanagi publishes mostly in Electrical and Electronic Engineering, Hardware and Architecture and Control and Systems Engineering, on topics such as Integrated Circuits and Semiconductor Failure Analysis, VLSI and Analog Circuit Testing and 3D IC and TSV technologies.
- World rank
- #7,706,248 of 7,710,434 ranked researchers
- Rank in Japan
- #382,945 of 383,136
- Works
- 180
- Citations
- 331
- Citations per work
- 1.8
What does Hiroyuki Yotsuyanagi research?
Hiroyuki Yotsuyanagi's work is mostly in Engineering (65%), Computer Science (25%).
Their six largest subfields, inside their fields and domains; the grey slice is everything else they publish. The interactive view splits every one of their works down to single topics.
The fields and subfields, with their numbers
- Physical Sciences16189.7%
- Engineering11764.9%
- Computer Science4524.8%
- Everything else1910.3%
- 1Electrical and Electronic Engineering57% of their works
- 2Hardware and Architecture23% of their works
- 3Control and Systems Engineering4% of their works
- 4Industrial and Manufacturing Engineering2% of their works
- 5Artificial Intelligence2% of their works
- 6Biomedical Engineering2% of their works
Research topics
- Integrated Circuits and Semiconductor Failure Analysis
- VLSI and Analog Circuit Testing
- 3D IC and TSV technologies
- Electrostatic Discharge in Electronics
- Semiconductor materials and devices
- Radiation Effects in Electronics
- Advancements in Semiconductor Devices and Circuit Design
- Low-power high-performance VLSI design
Which keywords describe Hiroyuki Yotsuyanagi's research?
The keywords of their largest research topics: Failure Analysis, Integrated Circuits, Embedded Cores, Test Data Compression, CMOS Technology, Interconnect, Through-Silicon Via and Nanoelectronics.
- Tunnel Field-Effect Transistors
- Low-Power
- Radiation Effects
- Atomic Layer Deposition
- SCR Devices
- Nanoelectronics
- Interconnect
- Test Data Compression
- Integrated Circuits
- Failure Analysis
- Embedded Cores
- CMOS Technology
- Through-Silicon Via
- ESD Protection
- Process Variation
- High-k Dielectrics
- Soft Errors
- Nanowire Transistors
- VLSI Circuits
Size is their works in the topics tagged with each word, from their 8 largest topics. Each links to the topic it comes from most.
All 19 words, with their numbers
- Failure Analysis1171 topic
- Integrated Circuits1171 topic
- Embedded Cores1061 topic
- Test Data Compression1061 topic
- CMOS Technology533 topics
- Interconnect431 topic
- Through-Silicon Via431 topic
- Nanoelectronics362 topics
- ESD Protection261 topic
- SCR Devices261 topic
- Process Variation242 topics
- Atomic Layer Deposition211 topic
- High-k Dielectrics211 topic
- Radiation Effects151 topic
- Soft Errors151 topic
- Low-Power121 topic
- Nanowire Transistors121 topic
- Tunnel Field-Effect Transistors121 topic
- VLSI Circuits121 topic
Where does Hiroyuki Yotsuyanagi work?
Hiroyuki Yotsuyanagi's main affiliation in the publication record is Tokushima University, Japan.
How many publications and citations does Hiroyuki Yotsuyanagi have?
OpenAlex counts 180 works and 331 citations for Hiroyuki Yotsuyanagi, an h-index of 9, ranking #7,706,248 of 7,710,434 researchers worldwide on the quality score.
Ranked on field-normalised excellence (50%), output (30%) and citations (20%). Counts come from OpenAlex author records, which occasionally merge different people who share a name or split one person into several.
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