Kenneth M. Butler
Kenneth M. Butler publishes mostly in Electrical and Electronic Engineering, Hardware and Architecture and Control and Systems Engineering, on topics such as VLSI and Analog Circuit Testing, Integrated Circuits and Semiconductor Failure Analysis and Engineering and Test Systems.
- World rank
- #110,035 of 1,633,909 ranked researchers
- Rank in United States
- #47,730 of 358,040
- Works
- 26
- Citations
- 237
- Citations per work
- 9.1
What does Kenneth M. Butler research?
Shares of their own output, by the field each of their topics belongs to. The grey slice is everything not listed.
- 1Electrical and Electronic Engineering46% of their works
- 2Hardware and Architecture33% of their works
- 3Control and Systems Engineering10% of their works
- 4Industrial and Manufacturing Engineering5% of their works
- 5Biomedical Engineering3% of their works
- 6Artificial Intelligence3% of their works
Research topics
- VLSI and Analog Circuit Testing
- Integrated Circuits and Semiconductor Failure Analysis
- Engineering and Test Systems
- VLSI and FPGA Design Techniques
- Radiation Effects in Electronics
- Industrial Vision Systems and Defect Detection
- Anomaly Detection Techniques and Applications
- Advanced Surface Polishing Techniques
Which keywords describe Kenneth M. Butler's research?
The keywords of their largest research topics: Embedded Cores, Test Data Compression, Failure Analysis, Integrated Circuits, ASIC, Deep Learning, Fault Diagnosis and FPGA.
- Material Removal Mechanism
- Anomaly Detection
- Radiation Effects
- Fabric Defect Detection
- Fault Diagnosis
- Deep Learning
- Integrated Circuits
- Test Data Compression
- Embedded Cores
- Failure Analysis
- ASIC
- FPGA
- Sequential Testing Algorithms
- Machine Vision
- Soft Errors
- Chemical Mechanical Planarization
- Unsupervised
Size is their works in the topics tagged with each word, from their 8 largest topics. Each links to the topic it comes from most.
All 17 words, with their numbers
- Embedded Cores131 topic
- Test Data Compression131 topic
- Failure Analysis101 topic
- Integrated Circuits101 topic
- ASIC31 topic
- Deep Learning32 topics
- FPGA31 topic
- Fault Diagnosis31 topic
- Sequential Testing Algorithms31 topic
- Fabric Defect Detection21 topic
- Machine Vision21 topic
- Radiation Effects21 topic
- Soft Errors21 topic
- Anomaly Detection11 topic
- Chemical Mechanical Planarization11 topic
- Material Removal Mechanism11 topic
- Unsupervised11 topic
Where does Kenneth M. Butler work?
Kenneth M. Butler's main affiliation in the publication record is Texas Instruments (United States), United States.
How many publications and citations does Kenneth M. Butler have?
Science Explorer counts 26 works and 237 citations for Kenneth M. Butler, ranking #110,035 of 1,633,909 researchers worldwide on the composite score.
Ranked on field-normalised excellence (50%), output (30%) and citations (20%). Counts come from OpenAlex author records, which occasionally merge different people who share a name or split one person into several.
Papers, co-authors, who cited this work and researchers on the nearest topics are in the interactive view on the map. Is this your page? Request a correction or removal.