N. Lindert
N. Lindert publishes mostly in Electrical and Electronic Engineering, Atomic and Molecular Physics, and Optics and Materials Chemistry, on topics such as Semiconductor materials and devices, Advancements in Semiconductor Devices and Circuit Design and Integrated Circuits and Semiconductor Failure Analysis.
- World rank
- #408,975 of 7,710,434 ranked researchers
- Rank in United States
- #144,862 of 1,627,098
- Works
- 25
- Citations
- 1.7k
- Citations per work
- 68.4
What does N. Lindert research?
N. Lindert's work is mostly in Engineering (92%), Physics and Astronomy (6%), Materials Science (3%).
Their six largest subfields, inside their fields and domains; the grey slice is everything else they publish. The interactive view splits every one of their works down to single topics.
The fields and subfields, with their numbers
- Physical Sciences25100.0%
- Engineering2391.8%
- Physics and Astronomy15.5%
- Materials Science12.7%
- 1Electrical and Electronic Engineering90% of their works
- 2Atomic and Molecular Physics, and Optics4% of their works
- 3Materials Chemistry3% of their works
- 4Biomedical Engineering1% of their works
- 5Condensed Matter Physics1% of their works
Research topics
- Semiconductor materials and devices
- Advancements in Semiconductor Devices and Circuit Design
- Integrated Circuits and Semiconductor Failure Analysis
- Silicon Carbide Semiconductor Technologies
- Low-power high-performance VLSI design
- Electrostatic Discharge in Electronics
- 3D IC and TSV technologies
- Semiconductor Quantum Structures and Devices
Which keywords describe N. Lindert's research?
The keywords of their largest research topics: Process Variation, Atomic Layer Deposition, High-k Dielectrics, Nanowire Transistors, Tunnel Field-Effect Transistors, CMOS Technology, Thermal Management and Failure Analysis.
- Semiconductor
- Quantum Dots
- ESD Protection
- VLSI Circuits
- Low-Power
- Failure Analysis
- CMOS Technology
- Nanowire Transistors
- Atomic Layer Deposition
- Process Variation
- High-k Dielectrics
- Tunnel Field-Effect Transistors
- Thermal Management
- Integrated Circuits
- Reliability
- Wide Bandgap Semiconductors
- Interconnect
- SCR Devices
- Through-Silicon Via
Size is their works in the topics tagged with each word, from their 8 largest topics. Each links to the topic it comes from most. The words come from the keyword list OpenAlex gives each topic, not from the text of the papers, so a word can appear that none of the papers uses.
All 19 words, with their numbers
- Process Variation252 topics
- Atomic Layer Deposition221 topic
- High-k Dielectrics221 topic
- Nanowire Transistors211 topic
- Tunnel Field-Effect Transistors211 topic
- CMOS Technology62 topics
- Thermal Management62 topics
- Failure Analysis51 topic
- Integrated Circuits51 topic
- Low-Power41 topic
- Reliability41 topic
- VLSI Circuits41 topic
- Wide Bandgap Semiconductors41 topic
- ESD Protection21 topic
- Interconnect21 topic
- Quantum Dots21 topic
- SCR Devices21 topic
- Semiconductor21 topic
- Through-Silicon Via21 topic
Where does N. Lindert work?
N. Lindert's main affiliation in the publication record is Intel (United States), United States.
How many publications and citations does N. Lindert have?
OpenAlex counts 25 works and 1,710 citations for N. Lindert, an h-index of 18, ranking #408,975 of 7,710,434 researchers worldwide on the quality score.
Ranked on field-normalised citation excellence (50%), output (30%) and citations (20%). Counts come from OpenAlex author records, which occasionally merge different people who share a name or split one person into several.
Papers, co-authors, who cited this work and researchers on the nearest topics have tabs of their own, above. Is this your page? Claim it with your ORCID iD, or request a correction or removal.
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