Rubin Parekhji
Rubin Parekhji publishes mostly in Electrical and Electronic Engineering, Hardware and Architecture and Control and Systems Engineering, on topics such as VLSI and Analog Circuit Testing, Radiation Effects in Electronics and Integrated Circuits and Semiconductor Failure Analysis.
- World rank
- #937,213 of 1,633,909 ranked researchers
- Rank in India
- #15,731 of 44,512
- Works
- 24
- Citations
- 52
- Citations per work
- 2.2
What does Rubin Parekhji research?
Shares of their own output, by the field each of their topics belongs to. The grey slice is everything not listed.
- 1Electrical and Electronic Engineering43% of their works
- 2Hardware and Architecture26% of their works
- 3Control and Systems Engineering10% of their works
- 4Software7% of their works
- 5Safety, Risk, Reliability and Quality7% of their works
- 6Computer Networks and Communications2% of their works
Research topics
- VLSI and Analog Circuit Testing
- Radiation Effects in Electronics
- Integrated Circuits and Semiconductor Failure Analysis
- Engineering and Test Systems
- Low-power high-performance VLSI design
- Safety Systems Engineering in Autonomy
- Software Reliability and Analysis Research
- Advancements in Semiconductor Devices and Circuit Design
Which keywords describe Rubin Parekhji's research?
The keywords of their largest research topics: Embedded Cores, Test Data Compression, CMOS Technology, Process Variation, Failure Analysis, Integrated Circuits, Radiation Effects and Soft Errors.
- Tunnel Field-Effect Transistors
- Nanowire Transistors
- Safety Assurance
- VLSI Circuits
- Low-Power
- Soft Errors
- Integrated Circuits
- Process Variation
- Test Data Compression
- Embedded Cores
- CMOS Technology
- Failure Analysis
- Radiation Effects
- Fault Diagnosis
- Sequential Testing Algorithms
- Assurance Cases
- Architecture-Based Approach
- Software Reliability Modeling
Size is their works in the topics tagged with each word, from their 8 largest topics. Each links to the topic it comes from most.
All 18 words, with their numbers
- Embedded Cores101 topic
- Test Data Compression101 topic
- CMOS Technology92 topics
- Process Variation62 topics
- Failure Analysis51 topic
- Integrated Circuits51 topic
- Radiation Effects51 topic
- Soft Errors51 topic
- Fault Diagnosis41 topic
- Low-Power41 topic
- Sequential Testing Algorithms41 topic
- VLSI Circuits41 topic
- Assurance Cases31 topic
- Safety Assurance31 topic
- Architecture-Based Approach21 topic
- Nanowire Transistors21 topic
- Software Reliability Modeling21 topic
- Tunnel Field-Effect Transistors21 topic
Where does Rubin Parekhji work?
Rubin Parekhji's main affiliation in the publication record is Texas Instruments (India), India.
How many publications and citations does Rubin Parekhji have?
Science Explorer counts 24 works and 52 citations for Rubin Parekhji, ranking #937,213 of 1,633,909 researchers worldwide on the composite score.
Ranked on field-normalised excellence (50%), output (30%) and citations (20%). Counts come from OpenAlex author records, which occasionally merge different people who share a name or split one person into several.
Papers, co-authors, who cited this work and researchers on the nearest topics are in the interactive view on the map. Is this your page? Request a correction or removal.