Travis E. Brist
Travis E. Brist publishes mostly in Electrical and Electronic Engineering, Industrial and Manufacturing Engineering and Biomedical Engineering, on topics such as Advancements in Photolithography Techniques, Integrated Circuits and Semiconductor Failure Analysis and Industrial Vision Systems and Defect Detection.
- World rank
- #7,042,729 of 7,710,434 ranked researchers
- Rank in United States
- #1,578,465 of 1,627,098
- Works
- 19
- Citations
- 55
- Citations per work
- 2.9
What does Travis E. Brist research?
Travis E. Brist's work is mostly in Engineering (81%), Materials Science (9%), Computer Science (4%).
Their six largest subfields, inside their fields and domains; the grey slice is everything else they publish. The interactive view splits every one of their works down to single topics.
The fields and subfields, with their numbers
- Physical Sciences1893.0%
- Engineering1580.7%
- Materials Science28.8%
- Computer Science13.5%
- Everything else17.0%
- 1Electrical and Electronic Engineering54% of their works
- 2Industrial and Manufacturing Engineering12% of their works
- 3Biomedical Engineering10% of their works
- 4Surfaces, Coatings and Films9% of their works
- 5Hardware and Architecture4% of their works
- 6Mechanical Engineering4% of their works
Research topics
- Advancements in Photolithography Techniques
- Integrated Circuits and Semiconductor Failure Analysis
- Industrial Vision Systems and Defect Detection
- Electron and X-Ray Spectroscopy Techniques
- VLSI and FPGA Design Techniques
- VLSI and Analog Circuit Testing
- Advanced Surface Polishing Techniques
- Nanofabrication and Lithography Techniques
Which keywords describe Travis E. Brist's research?
The keywords of their largest research topics: High-Resolution Patterning, Electron Beam Lithography, Nanofabrication, Fabric Defect Detection, Failure Analysis, Integrated Circuits, Machine Vision and Scanning Electron Microscopy.
- Soft Lithography
- Material Removal Mechanism
- Chemical Mechanical Planarization
- ASIC
- Scanning Electron Microscopy
- Integrated Circuits
- Fabric Defect Detection
- Electron Beam Lithography
- High-Resolution Patterning
- Nanofabrication
- Failure Analysis
- Machine Vision
- X-ray Photoelectron Spectroscopy
- FPGA
- Embedded Cores
- Nanolithography
- Test Data Compression
Size is their works in the topics tagged with each word, from their 8 largest topics. Each links to the topic it comes from most.
All 17 words, with their numbers
- High-Resolution Patterning212 topics
- Electron Beam Lithography191 topic
- Nanofabrication191 topic
- Fabric Defect Detection61 topic
- Failure Analysis61 topic
- Integrated Circuits61 topic
- Machine Vision61 topic
- Scanning Electron Microscopy51 topic
- X-ray Photoelectron Spectroscopy51 topic
- ASIC41 topic
- FPGA41 topic
- Chemical Mechanical Planarization21 topic
- Embedded Cores21 topic
- Material Removal Mechanism21 topic
- Nanolithography21 topic
- Soft Lithography21 topic
- Test Data Compression21 topic
Where does Travis E. Brist work?
Travis E. Brist's main affiliation in the publication record is Mentor Technologies, United States.
How many publications and citations does Travis E. Brist have?
OpenAlex counts 19 works and 55 citations for Travis E. Brist, an h-index of 4, ranking #7,042,729 of 7,710,434 researchers worldwide on the quality score.
Ranked on field-normalised excellence (50%), output (30%) and citations (20%). Counts come from OpenAlex author records, which occasionally merge different people who share a name or split one person into several.
Papers, co-authors, who cited this work and researchers on the nearest topics have tabs of their own, above. Is this your page? Claim it with your ORCID iD, or request a correction or removal.
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