Y. Zorian
Y. Zorian publishes mostly in Electrical and Electronic Engineering, Hardware and Architecture and Industrial and Manufacturing Engineering, on topics such as VLSI and Analog Circuit Testing, Integrated Circuits and Semiconductor Failure Analysis and Radiation Effects in Electronics.
- World rank
- #41,361 of 1,633,909 ranked researchers
- Rank in Switzerland
- #1,078 of 19,404
- Works
- 103
- Citations
- 593
- Citations per work
- 5.8
What does Y. Zorian research?
Shares of their own output, by the field each of their topics belongs to. The grey slice is everything not listed.
- 1Electrical and Electronic Engineering54% of their works
- 2Hardware and Architecture28% of their works
- 3Industrial and Manufacturing Engineering5% of their works
- 4Control and Systems Engineering4% of their works
- 5Safety, Risk, Reliability and Quality2% of their works
- 6Statistics, Probability and Uncertainty2% of their works
Research topics
- VLSI and Analog Circuit Testing
- Integrated Circuits and Semiconductor Failure Analysis
- Radiation Effects in Electronics
- VLSI and FPGA Design Techniques
- Semiconductor materials and devices
- Low-power high-performance VLSI design
- Advancements in Semiconductor Devices and Circuit Design
- Engineering and Test Systems
Which keywords describe Y. Zorian's research?
The keywords of their largest research topics: Embedded Cores, Test Data Compression, Failure Analysis, Integrated Circuits, CMOS Technology, Nanoelectronics, Radiation Effects and Soft Errors.
- Fault Diagnosis
- Nanowire Transistors
- Low-Power
- Atomic Layer Deposition
- ASIC
- Soft Errors
- Nanoelectronics
- Integrated Circuits
- Test Data Compression
- Embedded Cores
- Failure Analysis
- CMOS Technology
- Radiation Effects
- Process Variation
- FPGA
- High-k Dielectrics
- VLSI Circuits
- Tunnel Field-Effect Transistors
- Sequential Testing Algorithms
Size is their works in the topics tagged with each word, from their 8 largest topics. Each links to the topic it comes from most.
All 19 words, with their numbers
- Embedded Cores351 topic
- Test Data Compression351 topic
- Failure Analysis291 topic
- Integrated Circuits291 topic
- CMOS Technology202 topics
- Nanoelectronics202 topics
- Radiation Effects151 topic
- Soft Errors151 topic
- Process Variation92 topics
- ASIC81 topic
- FPGA81 topic
- Atomic Layer Deposition51 topic
- High-k Dielectrics51 topic
- Low-Power51 topic
- VLSI Circuits51 topic
- Nanowire Transistors41 topic
- Tunnel Field-Effect Transistors41 topic
- Fault Diagnosis31 topic
- Sequential Testing Algorithms31 topic
Where does Y. Zorian work?
Y. Zorian's main affiliation in the publication record is Synopsys (Switzerland), Switzerland.
How many publications and citations does Y. Zorian have?
Science Explorer counts 103 works and 593 citations for Y. Zorian, ranking #41,361 of 1,633,909 researchers worldwide on the composite score.
Ranked on field-normalised excellence (50%), output (30%) and citations (20%). Counts come from OpenAlex author records, which occasionally merge different people who share a name or split one person into several.
Papers, co-authors, who cited this work and researchers on the nearest topics are in the interactive view on the map. Is this your page? Request a correction or removal.