Yi‐Sheng Lin
Yi‐Sheng Lin publishes mostly in Electrical and Electronic Engineering, Industrial and Manufacturing Engineering and Hardware and Architecture, on topics such as Integrated Circuits and Semiconductor Failure Analysis, VLSI and Analog Circuit Testing and Industrial Vision Systems and Defect Detection.
- World rank
- #6,078,180 of 7,710,434 ranked researchers
- Rank in Taiwan
- #46,974 of 57,035
- Works
- 26
- Citations
- 128
- Citations per work
- 4.9
What does Yi‐Sheng Lin research?
Yi‐Sheng Lin's work is mostly in Engineering (67%), Computer Science (9%), Materials Science (7%).
Their six largest subfields, inside their fields and domains; the grey slice is everything else they publish. The interactive view splits every one of their works down to single topics.
The fields and subfields, with their numbers
- Physical Sciences2182.6%
- Engineering1766.6%
- Computer Science29.3%
- Materials Science26.7%
- Everything else517.4%
- 1Electrical and Electronic Engineering53% of their works
- 2Industrial and Manufacturing Engineering9% of their works
- 3Hardware and Architecture9% of their works
- 4Electronic, Optical and Magnetic Materials4% of their works
- 5Mechanical Engineering4% of their works
- 6Polymers and Plastics3% of their works
Research topics
- Integrated Circuits and Semiconductor Failure Analysis
- VLSI and Analog Circuit Testing
- Industrial Vision Systems and Defect Detection
- 3D IC and TSV technologies
- Electronic Packaging and Soldering Technologies
- Advancements in Photolithography Techniques
- Organic Electronics and Photovoltaics
- Copper Interconnects and Reliability
Which keywords describe Yi‐Sheng Lin's research?
The keywords of their largest research topics: Failure Analysis, Integrated Circuits, Embedded Cores, Fabric Defect Detection, Machine Vision, Test Data Compression, Electromigration and Interconnect.
- Low-k Dielectrics
- Bulk Heterojunction
- Electron Beam Lithography
- Interfacial Reactions
- Interconnect
- Test Data Compression
- Fabric Defect Detection
- Integrated Circuits
- Failure Analysis
- Embedded Cores
- Machine Vision
- Electromigration
- Through-Silicon Via
- Lead-free Solders
- Nanofabrication
- Conjugated Polymers
- Microelectronics
Size is their works in the topics tagged with each word, from their 8 largest topics. Each links to the topic it comes from most. The words come from the keyword list OpenAlex gives each topic, not from the text of the papers, so a word can appear that none of the papers uses.
All 17 words, with their numbers
- Failure Analysis141 topic
- Integrated Circuits141 topic
- Embedded Cores71 topic
- Fabric Defect Detection71 topic
- Machine Vision71 topic
- Test Data Compression71 topic
- Electromigration62 topics
- Interconnect61 topic
- Through-Silicon Via61 topic
- Interfacial Reactions41 topic
- Lead-free Solders41 topic
- Electron Beam Lithography31 topic
- Nanofabrication31 topic
- Bulk Heterojunction21 topic
- Conjugated Polymers21 topic
- Low-k Dielectrics21 topic
- Microelectronics21 topic
Where does Yi‐Sheng Lin work?
Yi‐Sheng Lin's main affiliation in the publication record is Advanced Semiconductor Engineering (Taiwan), Taiwan.
How many publications and citations does Yi‐Sheng Lin have?
OpenAlex counts 26 works and 128 citations for Yi‐Sheng Lin, an h-index of 5, ranking #6,078,180 of 7,710,434 researchers worldwide on the quality score.
Ranked on field-normalised citation excellence (50%), output (30%) and citations (20%). Counts come from OpenAlex author records, which occasionally merge different people who share a name or split one person into several.
Other researchers named Yi‐Sheng Lin
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