Nagesh Tamarapalli
Nagesh Tamarapalli publishes mostly in Electrical and Electronic Engineering, Hardware and Architecture and Control and Systems Engineering, on topics such as Integrated Circuits and Semiconductor Failure Analysis, VLSI and Analog Circuit Testing and Engineering and Test Systems.
- World rank
- #622,163 of 7,710,434 ranked researchers
- Rank in United States
- #212,753 of 1,627,098
- Works
- 24
- Citations
- 1.7k
- Citations per work
- 69.3
What does Nagesh Tamarapalli research?
Nagesh Tamarapalli's work is mostly in Engineering (65%), Computer Science (32%), Biochemistry, Genetics and Molecular Biology (1%).
Their six largest subfields, inside their fields and domains; the grey slice is everything else they publish. The interactive view splits every one of their works down to single topics.
The fields and subfields, with their numbers
- Physical Sciences2498.5%
- Engineering1665.2%
- Computer Science831.9%
- Physics and Astronomy01.4%
- Life Sciences01.4%
- 1Electrical and Electronic Engineering49% of their works
- 2Hardware and Architecture32% of their works
- 3Control and Systems Engineering10% of their works
- 4Industrial and Manufacturing Engineering7% of their works
- 5Structural Biology1% of their works
- 6Atomic and Molecular Physics, and Optics1% of their works
Research topics
- Integrated Circuits and Semiconductor Failure Analysis
- VLSI and Analog Circuit Testing
- Engineering and Test Systems
- Advancements in Photolithography Techniques
- Industrial Vision Systems and Defect Detection
- Low-power high-performance VLSI design
- VLSI and FPGA Design Techniques
- Advanced Electron Microscopy Techniques and Applications
Which keywords describe Nagesh Tamarapalli's research?
The keywords of their largest research topics: Failure Analysis, Integrated Circuits, Embedded Cores, Test Data Compression, Fault Diagnosis, Sequential Testing Algorithms, Electron Beam Lithography and Fabric Defect Detection.
- Single-Particle Analysis
- VLSI Circuits
- FPGA
- Nanofabrication
- Fabric Defect Detection
- Sequential Testing Algorithms
- Test Data Compression
- Integrated Circuits
- Failure Analysis
- Embedded Cores
- Fault Diagnosis
- Electron Beam Lithography
- Machine Vision
- ASIC
- Low-Power
- Cryo-Electron Microscopy
Size is their works in the topics tagged with each word, from their 8 largest topics. Each links to the topic it comes from most. The words come from the keyword list OpenAlex gives each topic, not from the text of the papers, so a word can appear that none of the papers uses.
All 16 words, with their numbers
- Failure Analysis241 topic
- Integrated Circuits241 topic
- Embedded Cores221 topic
- Test Data Compression221 topic
- Fault Diagnosis71 topic
- Sequential Testing Algorithms71 topic
- Electron Beam Lithography51 topic
- Fabric Defect Detection51 topic
- Machine Vision51 topic
- Nanofabrication51 topic
- ASIC21 topic
- FPGA21 topic
- Low-Power21 topic
- VLSI Circuits21 topic
- Cryo-Electron Microscopy11 topic
- Single-Particle Analysis11 topic
Where does Nagesh Tamarapalli work?
Nagesh Tamarapalli's main affiliation in the publication record is Mentor Technologies, United States.
How many publications and citations does Nagesh Tamarapalli have?
OpenAlex counts 24 works and 1,663 citations for Nagesh Tamarapalli, an h-index of 15, ranking #622,163 of 7,710,434 researchers worldwide on the quality score.
Ranked on field-normalised citation excellence (50%), output (30%) and citations (20%). Counts come from OpenAlex author records, which occasionally merge different people who share a name or split one person into several.
Papers, co-authors, who cited this work and researchers on the nearest topics have tabs of their own, above. Is this your page? Claim it with your ORCID iD, or request a correction or removal.
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