J. Rajski
J. Rajski publishes mostly in Electrical and Electronic Engineering, Hardware and Architecture and Control and Systems Engineering, on topics such as VLSI and Analog Circuit Testing, Integrated Circuits and Semiconductor Failure Analysis and Engineering and Test Systems.
- World rank
- #79,700 of 1,633,909 ranked researchers
- Rank in United States
- #35,522 of 358,040
- Works
- 29
- Citations
- 247
- Citations per work
- 8.5
What does J. Rajski research?
Shares of their own output, by the field each of their topics belongs to. The grey slice is everything not listed.
- 1Electrical and Electronic Engineering51% of their works
- 2Hardware and Architecture33% of their works
- 3Control and Systems Engineering13% of their works
- 4Industrial and Manufacturing Engineering3% of their works
Research topics
- VLSI and Analog Circuit Testing
- Integrated Circuits and Semiconductor Failure Analysis
- Engineering and Test Systems
- Advancements in Photolithography Techniques
- Low-power high-performance VLSI design
- Radiation Effects in Electronics
- VLSI and FPGA Design Techniques
- Industrial Vision Systems and Defect Detection
Which keywords describe J. Rajski's research?
The keywords of their largest research topics: Embedded Cores, Failure Analysis, Integrated Circuits, Test Data Compression, Fault Diagnosis, Sequential Testing Algorithms, CMOS Technology and Electron Beam Lithography.
- Radiation Effects
- Fabric Defect Detection
- ASIC
- Low-Power
- Electron Beam Lithography
- Sequential Testing Algorithms
- Test Data Compression
- Failure Analysis
- Embedded Cores
- Integrated Circuits
- Fault Diagnosis
- CMOS Technology
- Nanofabrication
- VLSI Circuits
- FPGA
- Machine Vision
- Soft Errors
Size is their works in the topics tagged with each word, from their 8 largest topics. Each links to the topic it comes from most.
All 17 words, with their numbers
- Embedded Cores131 topic
- Failure Analysis131 topic
- Integrated Circuits131 topic
- Test Data Compression131 topic
- Fault Diagnosis51 topic
- Sequential Testing Algorithms51 topic
- CMOS Technology32 topics
- Electron Beam Lithography31 topic
- Nanofabrication31 topic
- Low-Power21 topic
- VLSI Circuits21 topic
- ASIC11 topic
- FPGA11 topic
- Fabric Defect Detection11 topic
- Machine Vision11 topic
- Radiation Effects11 topic
- Soft Errors11 topic
Where does J. Rajski work?
J. Rajski's main affiliation in the publication record is Mentor Technologies, United States.
How many publications and citations does J. Rajski have?
Science Explorer counts 29 works and 247 citations for J. Rajski, ranking #79,700 of 1,633,909 researchers worldwide on the composite score.
Ranked on field-normalised excellence (50%), output (30%) and citations (20%). Counts come from OpenAlex author records, which occasionally merge different people who share a name or split one person into several.
Papers, co-authors, who cited this work and researchers on the nearest topics are in the interactive view on the map. Is this your page? Request a correction or removal.