Janusz Rajski
Janusz Rajski publishes mostly in Electrical and Electronic Engineering, Hardware and Architecture and Control and Systems Engineering, on topics such as VLSI and Analog Circuit Testing, Integrated Circuits and Semiconductor Failure Analysis and Engineering and Test Systems.
- World rank
- #650,688 of 7,710,434 ranked researchers
- Rank in United States
- #221,580 of 1,627,098
- Works
- 72
- Citations
- 2.8k
- Citations per work
- 38.8
What does Janusz Rajski research?
Janusz Rajski's work is mostly in Engineering (63%), Computer Science (36%).
Their six largest subfields, inside their fields and domains; the grey slice is everything else they publish. The interactive view splits every one of their works down to single topics.
The fields and subfields, with their numbers
- Physical Sciences7198.5%
- Engineering4562.7%
- Computer Science2635.8%
- Everything else11.5%
- 1Electrical and Electronic Engineering54% of their works
- 2Hardware and Architecture34% of their works
- 3Control and Systems Engineering7% of their works
- 4Computer Networks and Communications1% of their works
- 5Industrial and Manufacturing Engineering1% of their works
- 6Artificial Intelligence1% of their works
Research topics
Which keywords describe Janusz Rajski's research?
The keywords of their largest research topics: Embedded Cores, Test Data Compression, Failure Analysis, Integrated Circuits, CMOS Technology, Nanoelectronics, Fault Diagnosis and Sequential Testing Algorithms.
- High-k Dielectrics
- FPGA
- VLSI Circuits
- Low-Power
- Soft Errors
- Sequential Testing Algorithms
- Nanoelectronics
- Integrated Circuits
- Test Data Compression
- Embedded Cores
- Failure Analysis
- CMOS Technology
- Fault Diagnosis
- Radiation Effects
- Electron Beam Lithography
- Nanofabrication
- ASIC
- Atomic Layer Deposition
Size is their works in the topics tagged with each word, from their 8 largest topics. Each links to the topic it comes from most.
All 18 words, with their numbers
- Embedded Cores701 topic
- Test Data Compression701 topic
- Failure Analysis671 topic
- Integrated Circuits671 topic
- CMOS Technology232 topics
- Nanoelectronics172 topics
- Fault Diagnosis161 topic
- Sequential Testing Algorithms161 topic
- Radiation Effects131 topic
- Soft Errors131 topic
- Electron Beam Lithography101 topic
- Low-Power101 topic
- Nanofabrication101 topic
- VLSI Circuits101 topic
- ASIC81 topic
- FPGA81 topic
- Atomic Layer Deposition41 topic
- High-k Dielectrics41 topic
Where does Janusz Rajski work?
Janusz Rajski's main affiliation in the publication record is Mentor Technologies, United States.
How many publications and citations does Janusz Rajski have?
OpenAlex counts 72 works and 2,796 citations for Janusz Rajski, an h-index of 24, ranking #650,688 of 7,710,434 researchers worldwide on the quality score.
Ranked on field-normalised excellence (50%), output (30%) and citations (20%). Counts come from OpenAlex author records, which occasionally merge different people who share a name or split one person into several.
Other researchers named Janusz Rajski
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