Kun-Han Hans Tsai
Kun-Han Hans Tsai publishes mostly in Electrical and Electronic Engineering, Hardware and Architecture and Control and Systems Engineering, on topics such as Integrated Circuits and Semiconductor Failure Analysis, VLSI and Analog Circuit Testing and 3D IC and TSV technologies.
- World rank
- #1,964,775 of 7,710,434 ranked researchers
- Rank in United States
- #597,743 of 1,627,098
- Works
- 81
- Citations
- 1.9k
- Citations per work
- 22.8
What does Kun-Han Hans Tsai research?
Kun-Han Hans Tsai's work is mostly in Engineering (67%), Computer Science (31%).
Their six largest subfields, inside their fields and domains; the grey slice is everything else they publish. The interactive view splits every one of their works down to single topics.
The fields and subfields, with their numbers
- Physical Sciences8098.4%
- Engineering5467.0%
- Computer Science2531.4%
- Everything else11.6%
- 1Electrical and Electronic Engineering58% of their works
- 2Hardware and Architecture31% of their works
- 3Control and Systems Engineering5% of their works
- 4Biomedical Engineering2% of their works
- 5Industrial and Manufacturing Engineering1% of their works
- 6Computer Networks and Communications1% of their works
Research topics
Which keywords describe Kun-Han Hans Tsai's research?
The keywords of their largest research topics: Failure Analysis, Integrated Circuits, Embedded Cores, Test Data Compression, Interconnect, Through-Silicon Via, CMOS Technology and Fault Diagnosis.
- Electron Beam Lithography
- Low-Power
- Radiation Effects
- ASIC
- Fault Diagnosis
- Through-Silicon Via
- Test Data Compression
- Integrated Circuits
- Failure Analysis
- Embedded Cores
- Interconnect
- CMOS Technology
- Sequential Testing Algorithms
- FPGA
- Soft Errors
- VLSI Circuits
- Nanofabrication
Size is their works in the topics tagged with each word, from their 8 largest topics. Each links to the topic it comes from most.
All 17 words, with their numbers
- Failure Analysis691 topic
- Integrated Circuits691 topic
- Embedded Cores671 topic
- Test Data Compression671 topic
- Interconnect211 topic
- Through-Silicon Via211 topic
- CMOS Technology192 topics
- Fault Diagnosis131 topic
- Sequential Testing Algorithms131 topic
- ASIC111 topic
- FPGA111 topic
- Radiation Effects101 topic
- Soft Errors101 topic
- Low-Power91 topic
- VLSI Circuits91 topic
- Electron Beam Lithography71 topic
- Nanofabrication71 topic
Where does Kun-Han Hans Tsai work?
Kun-Han Hans Tsai's main affiliation in the publication record is Mentor Technologies, United States.
How many publications and citations does Kun-Han Hans Tsai have?
OpenAlex counts 81 works and 1,850 citations for Kun-Han Hans Tsai, an h-index of 21, ranking #1,964,775 of 7,710,434 researchers worldwide on the quality score.
Ranked on field-normalised excellence (50%), output (30%) and citations (20%). Counts come from OpenAlex author records, which occasionally merge different people who share a name or split one person into several.
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